薄膜微区厚度测定计算程序——Monte Carlo模拟

A CALCULATION PROGRAM OF DETERMINING THICKNESSES OF THIN FILMS ON SUBSTRATES BY MONTE CARLO SIMULATION

  • 摘要: 根据作者发展的理论和计算方法1-8,编制了有衬底薄膜厚度测定的计算程序。本程序使用方便,已广泛应用于各类功能薄膜材料的测定计算中。

     

    Abstract: On the basis of author's theories and calculation method1,2,3,we made a evaluation program of determining thicknesses of thin films on substrates.The software can be conveniently operated,and have already been extensively applied to the calculations for determining thicknesses of avariety of film materials.

     

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